Research Catalog
Automatic Testing '80 Conference proceedings : Palais des Congrès, Paris, France, 23, 24, 25 September, 1980.
- Title
- Automatic Testing '80 Conference proceedings : Palais des Congrès, Paris, France, 23, 24, 25 September, 1980.
- Author
- Automatic Testing '80 Conference (1980 : Paris, France)
- Publication
- Buckingham, Buckshire : Network, d1980.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSG 84-98 | Offsite |
Details
- Additional Authors
- Institution of Electronic and Radio Engineers.
- Description
- 3 v. : ill.; 30 cm.
- Alternative Title
- Automatic Testing Eighty Conference proceedings.
- Subject
- Automatic test equipment > Congresses
- Note
- Cover title.
- "A joint IERE/Network conference ... supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the journals Test! and New electronics"--v. 1, p. [iii].
- Language (note)
- English and French.
- Contents
- session 1. Production testing and testing of PCB and components -- session 2. Maintenance testing, testing of telecom systems and military applications -- session 3. Future trends and software.
- Call Number
- JSG 84-98
- ISBN
- 0904999785 (v. 1)
- OCLC
- NYPG006000317-B
- Conference
- Automatic Testing '80 Conference (1980 : Paris, France)
- Title
- Automatic Testing '80 Conference proceedings : Palais des Congrès, Paris, France, 23, 24, 25 September, 1980.
- Imprint
- Buckingham, Buckshire : Network, d1980.
- Language
- English and French.
- Added Author
- Institution of Electronic and Radio Engineers.
- Added Title
- Automatic Testing Eighty Conference proceedings.
- Research Call Number
- JSG 84-98