Research Catalog
Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.
- Title
- Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.
- Author
- Japan-U.S. Seminar on the Learning Process in Control Systems (1970 : Nagoya, Japan)
- Publication
- New York, Plenum Press, 1971.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Book/Text | Request in advance | JSF 72-68 | Offsite |
Details
- Additional Authors
- Fu, K. S. (King Sun), 1930-
- Description
- ix, 343 p. illus.; 26 cm.
- Subjects
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- JSF 72-68
- ISBN
- 0306305461
- LCCN
- 77163287
- OCLC
- NYPG720143445-B
- Conference
- Japan-U.S. Seminar on the Learning Process in Control Systems (1970 : Nagoya, Japan)
- Title
- Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.
- Imprint
- New York, Plenum Press, 1971.
- Bibliography
- Includes bibliographical references.
- Added Author
- Fu, K. S. (King Sun), 1930-
- Research Call Number
- JSF 72-68