Research Catalog

Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.

Title
Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.
Author
Japan-U.S. Seminar on the Learning Process in Control Systems (1970 : Nagoya, Japan)
Publication
New York, Plenum Press, 1971.

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StatusFormatAccessCall NumberItem Location
Book/TextRequest in advance JSF 72-68Offsite

Details

Additional Authors
Fu, K. S. (King Sun), 1930-
Description
ix, 343 p. illus.; 26 cm.
Subjects
Bibliography (note)
  • Includes bibliographical references.
Call Number
JSF 72-68
ISBN
0306305461
LCCN
77163287
OCLC
NYPG720143445-B
Conference
Japan-U.S. Seminar on the Learning Process in Control Systems (1970 : Nagoya, Japan)
Title
Pattern recognition and machine learning; proceedings. Edited by K. S. Fu.
Imprint
New York, Plenum Press, 1971.
Bibliography
Includes bibliographical references.
Added Author
Fu, K. S. (King Sun), 1930-
Research Call Number
JSF 72-68
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