Research Catalog

Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.

Title
Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.
Publication
Philadelphia, American Society for Testing Materials [1972]

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Details

Additional Authors
  • American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction.
  • American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography.
  • American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis.
Description
182 p. illus.; 24 cm.
Series Statement
American Society for Testing and Materials. Special technical publication, \504
Uniform Title
ASTM special technical publication ; \504.
Subjects
Note
  • Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials.
Bibliography (note)
  • Includes bibliographical references.
Call Number
VEE (American Society for Testing and Materials. Special technical publication. no. 504)
LCCN
79186851
OCLC
  • 448165
  • NYPG744603069-B
Title
Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.
Imprint
Philadelphia, American Society for Testing Materials [1972]
Series
American Society for Testing and Materials. Special technical publication, \504
ASTM special technical publication ; \504.
Bibliography
Includes bibliographical references.
Added Author
American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction.
American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography.
American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis.
Research Call Number
VEE (American Society for Testing and Materials. Special technical publication. no. 504)
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