Research Catalog
Computed electron micrographs and defect identification
- Title
- Computed electron micrographs and defect identification [by] A. K. Head [and others]
- Publication
- Amsterdam, North-Holland Pub. Co.; New York, American Elsevier Pub. Co., 1973.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Request in advance | JSD 75-264 | Offsite |
Details
- Additional Authors
- Head, A. K.
- Description
- x, 400 p. illus.; 23 cm.
- Series Statement
- Defects in crystalline solids, v. 7
- Subject
- Note
- Errata slip inserted.
- Bibliography (note)
- Bibliography: p. [387]-389.
- Call Number
- JSD 75-264
- OCLC
- 887441
- NYPG754251557-B
- Title
- Computed electron micrographs and defect identification [by] A. K. Head [and others]
- Imprint
- Amsterdam, North-Holland Pub. Co.; New York, American Elsevier Pub. Co., 1973.
- Series
- Defects in crystalline solids, v. 7
- Bibliography
- Bibliography: p. [387]-389.
- Added Author
- Head, A. K.
- Research Call Number
- JSD 75-264