Research Catalog
Physical aspects of electron microscopy and microbeam analysis
- Title
- Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Author
- Siegel, Benjamin M.
- Publication
- New York : Wiley, [1975]
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 75-1300 | Offsite |
Details
- Additional Authors
- Description
- xiii, 474 p. : ill.; 26 cm.
- Subjects
- Note
- Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
- "A Wiley biomedical-health publication."
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 75-1300
- ISBN
- 0471790206
- LCCN
- 74022483
- OCLC
- 1085871
- NYPG754777373-B
- Author
- Siegel, Benjamin M.
- Title
- Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Imprint
- New York : Wiley, [1975]
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Beaman, Donald Robert.Electron Microscopy Society of America.Microbeam Analysis Society.
- Research Call Number
- JSF 75-1300