Research Catalog
Defect analysis in electron microscopy
- Title
- Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.
- Author
- Loretto, M. H.
- Publication
- London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, c1975.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Book/Text | Request in advance | JSE 76-978 | Offsite |
Details
- Additional Authors
- Smallman, R. E.
- Description
- ix, 134 p. : ill.; 24 cm.
- Subjects
- Note
- "A Halsted Press book."
- Includes index.
- Bibliography (note)
- Bibliography: p. 131.
- Call Number
- JSE 76-978
- ISBN
- 0412137607. a0412137704 bpbk. (canceled/invalid)
- LCCN
- 75025615
- OCLC
- 1582682
- NYPG764577775-B
- Author
- Loretto, M. H.
- Title
- Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.
- Imprint
- London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, c1975.
- Bibliography
- Bibliography: p. 131.
- Added Author
- Smallman, R. E.
- Research Call Number
- JSE 76-978