Research Catalog
Spectral reflectance date and its applicability to terrain studies by aerial photography. [By J. E. Walker and J. C. Little, Broadview Research Corp.; C. N. Johnson, Jr., and S. E. Dwornik, U. S. Army Engineer Research and Development Laboratories]
- Title
- Spectral reflectance date and its applicability to terrain studies by aerial photography. [By J. E. Walker and J. C. Little, Broadview Research Corp.; C. N. Johnson, Jr., and S. E. Dwornik, U. S. Army Engineer Research and Development Laboratories]
- Author
- Broadview Research Corporation.
- Publication
- Burlingame, Calif. [1959?]
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 73-641 | Offsite |
Details
- Additional Authors
- Description
- iii, 25 l. illus.; 28 cm.
- Subjects
- Note
- "Paper presented at the annual meeting of the American Association for the Advancement of Science, December 28, 1959."
- Call Number
- JSF 73-641
- OCLC
- NYPG764635476-B
- Author
- Broadview Research Corporation.
- Title
- Spectral reflectance date and its applicability to terrain studies by aerial photography. [By J. E. Walker and J. C. Little, Broadview Research Corp.; C. N. Johnson, Jr., and S. E. Dwornik, U. S. Army Engineer Research and Development Laboratories]
- Imprint
- Burlingame, Calif. [1959?]
- Added Author
- Walker, John Elwyn, 1931-Johnson, Charles Nelson, 1915-United States. Army. Engineer Research and Development Laboratories.
- Research Call Number
- JSF 73-641