Research Catalog
Characterization of epitaxial semiconductor films
- Title
- Characterization of epitaxial semiconductor films / edited by Henry Kressel.
- Publication
- Amsterdam ; New York : Elsevier Scientific Pub. Co., 1976.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 76-1386 | Offsite |
Details
- Additional Authors
- Kressel, Henry.
- Description
- xii, 216 p. : ill.; 25 cm.
- Series Statement
- Methods and phenomena, their applications in science and technology, v. 2
- Subjects
- Note
- "Published as a special issue of Thin solid films, vol. 31, issues 1 and 2."
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- JSE 76-1386
- ISBN
- 044441438X (American Elsevier)
- LCCN
- 76372967
- OCLC
- 2464043
- NYPG764766322-B
- Title
- Characterization of epitaxial semiconductor films / edited by Henry Kressel.
- Imprint
- Amsterdam ; New York : Elsevier Scientific Pub. Co., 1976.
- Series
- Methods and phenomena, their applications in science and technology, v. 2
- Bibliography
- Includes bibliographical references.
- Added Author
- Kressel, Henry.
- Research Call Number
- JSE 76-1386