Research Catalog

Title

Ion beam surface layer analysis; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation. Edited by: James W. Mayer and James F. Ziegler.

Author

International Conference on Ion Beam Surface Layer Analysis (1973 : Yorktown Heights, N.Y.)

Publication

Lausanne, Elsevier Sequoia S. A., [distributed in the U. S. A. by American Elsevier Publishing Co., New York] 1974.

Items in the Library & Off-site

Details

Additional Authors

• Mayer, James W., 1930-
• Ziegler, J. F. (James F.).
• National Science Foundation (U.S.)
• International Business Machines Corporation.

Description

viii, 463 p. illus.; 25 cm.

Subject

Thin films > Congresses

Note

• "These proceedings were originally published in Thin solid films."

Bibliography (note)

• Includes bibliographical references.

Call Number

JSE 76-264

ISBN

044419536X

LCCN

74000348

OCLC

• 1046772
• NYPG764110385-B

Conference

International Conference on Ion Beam Surface Layer Analysis (1973 : Yorktown Heights, N.Y.)

Title

Ion beam surface layer analysis; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation. Edited by: James W. Mayer and James F. Ziegler.

Imprint

Lausanne, Elsevier Sequoia S. A., [distributed in the U. S. A. by American Elsevier Publishing Co., New York] 1974.

Bibliography

Includes bibliographical references.

Added Author

Mayer, James W., 1930-

Ziegler, J. F. (James F.).

National Science Foundation (U.S.)

International Business Machines Corporation.

Research Call Number

JSE 76-264