Research Catalog

Proceedings.

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Item details
Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 11	Book/Text	Request in advance	TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings) v. 11	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 5	Book/Text	Request in advance	TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings) v. 5	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 4	Book/Text	Request in advance	TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings) v. 4	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 3	Book/Text	Request in advance	TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings) v. 3	Offsite

Additional Authors

Description

ill., diagrs.; 28 cm.

Subject

Note

Sponsored by Institute of Electrical and Electronics Engineers, American Society for Quality Control and other similar organizations.
Continued by: Symposium on Reliability. Proceedings (Not in the library)

Call Number

TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings)

LCCN

55003103

OCLC

NYPG764207950-S

Conference

National Symposium on Reliability and Quality Control.

Title

Proceedings.

Imprint

[New York]

Added Author

Institute of Electrical and Electronics Engineers.

American Society for Quality Control.

Research Call Number

TTE (National Symposium on Reliability and Quality Control in Electronics. Proceedings)