Research Catalog
Failure analysis with the electron microscope
- Title
- Failure analysis with the electron microscope, by Nathan A. Tiner.
- Author
- Tiner, Nathan A.
- Publication
- Los Angeles, Fox-Mathis publications [c1973]
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 78-302 | Offsite |
Details
- Description
- viii, 177 p. illus.; 24 cm.
- Subject
- Note
- Imprint part. covered by label: Distributed exclusively in the U. S. A. by Scholium International Inc, Flushing, N. Y.
- Bibliography (note)
- Includes bibliographies.
- Call Number
- JSE 78-302
- OCLC
- 1241098
- NYPG784517571-B
- Author
- Tiner, Nathan A.
- Title
- Failure analysis with the electron microscope, by Nathan A. Tiner.
- Imprint
- Los Angeles, Fox-Mathis publications [c1973]
- Bibliography
- Includes bibliographies.
- Research Call Number
- JSE 78-302