Research Catalog

Title

Characterization of crystal growth defects by X-ray methods : proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, Held Aug. 29-Sept. 10, 1979, at Durham University, Durham, United Kingdom / edited by Brian K. Tanner and D. Keith Bowen.

Author

Nato Avanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England)

Publication

New York, N.Y. : Plenum Press, c1980.

Items in the Library & Off-site

Details

Additional Authors

• Tanner, B. K. (Brian Keith)
• Bowen, D. Keith (David Keith), 1940-

Description

xxvi, 589 p. : ill.; 26 cm.

Series Statement

NATO advanced study institutes series : Series B, Physics ; \v. 63

Subject

• Crystals > Defects > Congresses
• X-ray crystallography > Congresses

Note

• "Published in cooperation with NATO Scientific Affairs Division."

Bibliography (note)

• Includes bibliographical references and index.

Call Number

JSF 81-514

ISBN

0306406284

LCCN

80026509

OCLC

• 6942201
• NYPG81-B8927

Conference

Nato Avanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England)

Title

Characterization of crystal growth defects by X-ray methods : proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, Held Aug. 29-Sept. 10, 1979, at Durham University, Durham, United Kingdom / edited by Brian K. Tanner and D. Keith Bowen.

Imprint

New York, N.Y. : Plenum Press, c1980.

Series

NATO advanced study institutes series : Series B, Physics ; \v. 63

Bibliography

Includes bibliographical references and index.

Added Author

Tanner, B. K. (Brian Keith)

Bowen, D. Keith (David Keith), 1940-

Research Call Number

JSF 81-514