Research Catalog
Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980
- Title
- Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- Author
- Test Conference (11th : 1980 : Philadelphia, Pa.)
- Publication
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 83-274 | Offsite |
Details
- Additional Authors
- Description
- xv, 507 p. : ill.; 28 cm.
- Subject
- Integrated circuits > Testing > Congresses
- Note
- "80CH1608-9."
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 83-274
- LCCN
- 80083501
- OCLC
- NYPG83-B69483
- Conference
- Test Conference (11th : 1980 : Philadelphia, Pa.)
- Title
- Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- Imprint
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- IEEE Computer Society. Test Technology Committee.Institute of Electrical and Electronics Engineers. Philadelphia Section.
- Research Call Number
- JSF 83-274