Research Catalog
Electron and ion microscopy and microanalysis : principles and applications
- Title
- Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Author
- Murr, Lawrence Eugene.
- Publication
- New York : Marcel Dekker, c1982.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 83-370 | Offsite |
Details
- Description
- xiv, 793 p. : ill.; 27 cm.
- Series Statement
- Optical engineering ; v. 1
- Subject
- Bibliography (note)
- Includes bibliographical references and indexes.
- Call Number
- JSF 83-370
- ISBN
- 0824715535
- LCCN
- 82014872
- OCLC
- 8689690
- NYPG83-B71314
- Author
- Murr, Lawrence Eugene.
- Title
- Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Imprint
- New York : Marcel Dekker, c1982.
- Series
- Optical engineering ; v. 1
- Bibliography
- Includes bibliographical references and indexes.
- Research Call Number
- JSF 83-370