Research Catalog
Applications of x-ray topographic methods to materials science
- Title
- Applications of x-ray topographic methods to materials science / edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
- Publication
- New York : Plenum Press, c1984.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 86-200 | Offsite |
Details
- Additional Authors
- Description
- xiii, 536 p. : ill.; 26 cm.
- Subject
- Note
- "Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso.
- Bibliography (note)
- Includes bibliographies and index.
- Call Number
- JSF 86-200
- ISBN
- 030641838X
- LCCN
- 84018100
- OCLC
- 11187686
- NYPG85-B24986
- Title
- Applications of x-ray topographic methods to materials science / edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
- Imprint
- New York : Plenum Press, c1984.
- Bibliography
- Includes bibliographies and index.
- Added Author
- Weissmann, Sigmund.Balibar, Françoise.Petroff, Jean-François.Centre national de la recherche scientifique (France)National Science Foundation (U.S.)France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science (1983 : Snowmass Village, Colo.)
- Research Call Number
- JSF 86-200