Research Catalog

The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984

Title
The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Author
International Test Conference (15th : 1984 : Philadelphia, Pa.)
Publication
Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xxxi, 886 p. : ill.; 28 cm.
Alternative Title
  • IEEE 1984 test conference.
  • International Test Conference, 1984 proceedings.
Subject
  • Integrated circuits > Testing > Congresses
  • Electronic digital computers > Testing > Congresses
  • Automatic test equipment > Congresses
Note
  • Cover and spine title: IEEE 1984 test conference.
  • "IEEE catalog no. 84CH2084-2."
  • "Computer Society order no. 548."
  • Cover title: IEEE 1984 test conference.
Bibliography (note)
  • Includes bibliographical references and index.
Call Number
JSF 85-139
ISBN
0818605480 (pbk.)
LCCN
84081879
OCLC
  • 11488661
  • 11488661
Conference
International Test Conference (15th : 1984 : Philadelphia, Pa.)
Title
The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Imprint
Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
Bibliography
Includes bibliographical references and index.
Added Author
IEEE Computer Society. Test Technology Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Added Title
IEEE 1984 test conference.
International Test Conference, 1984 proceedings.
Research Call Number
JSF 85-139
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