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Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

Title: Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors, A. Benninghoven ... [et al.].
Publication: Berlin ; New York : Springer-Verlag, 1984.

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Description

xv, 503 p. : ill.; 24 cm.

Series Statement

Springer series in chemical physics ; \36

Subject

Secondary ion mass spectrometry > Congresses

Bibliography (note)

Includes bibliographies and index.

Call Number

JSE 85-217

ISBN

038713316X (U.S.)

LCCN

84005330

OCLC

10557609
10557609

Title

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors, A. Benninghoven ... [et al.].

Imprint

Berlin ; New York : Springer-Verlag, 1984.

Series

Springer series in chemical physics ; \36

Bibliography

Includes bibliographies and index.

Added Author

Benninghoven, A.

Nihon Gakujutsu Shinkōkai.

Research Call Number

JSE 85-217

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