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Testing's impact on design & technology : International Test Conference, 1986 proceedings, September 8, 9, 10, 11, 1986

Title: Testing's impact on design & technology : International Test Conference, 1986 proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
Publication: Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.

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Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	JSF 86-1238	Offsite

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Details

Additional Authors

Description

xxx, 1009 p. : ill.; 28 cm.

Alternative Title

International Test Conference 1986 proceedings.
Testing's impact on design and technology.
I.E.E.E. 1986 Test Conference.

Subjects

Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses

Note

"IEEE catalog no. 86CH2339-0."
"Computer Society order no. 726."
Spine title: I.E.E.E. 1986 Test Conference.

Bibliography (note)

Includes bibliographies and index.

Call Number

JSF 86-1238

ISBN

0818607262 (pbk.)
0818647264 (microfiche)
0818687266 (hard)

OCLC

14277634
14277634

Title

Testing's impact on design & technology : International Test Conference, 1986 proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.

Imprint

Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.

Bibliography

Includes bibliographies and index.

Added Author

IEEE Computer Society.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Added Title

International Test Conference 1986 proceedings.

Testing's impact on design and technology.

I.E.E.E. 1986 Test Conference.

Research Call Number

JSF 86-1238

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