Research Catalog

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

Title
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Publication
Pittsburgh, Pa. : Materials Research Society, c1985.

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Details

Additional Authors
  • Johnson, Noble M.
  • Bishop, Stephen G.
  • Watkins, George D.
  • Materials Research Society.
Description
xv, 604 p. : ill.; 24 cm.
Series Statement
Materials Research Society symposia proceedings, 0272-9172 ; v. 46
Subjects
Bibliography (note)
  • Includes bibliographies and indexes.
Call Number
JSE 86-417
ISBN
0931837111
LCCN
85019753
OCLC
  • 12557554
  • NYPG86-B14084
Title
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Imprint
Pittsburgh, Pa. : Materials Research Society, c1985.
Series
Materials Research Society symposia proceedings, 0272-9172 ; v. 46
Bibliography
Includes bibliographies and indexes.
Added Author
Johnson, Noble M.
Bishop, Stephen G.
Watkins, George D.
Materials Research Society.
Research Call Number
JSE 86-417
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