Research Catalog

Thin film and depth profile analysis

Title: Thin film and depth profile analysis / edited by H. Oechsner ; with contributions by H.-W. Etzkorn ... [et al.].
Publication: Berlin ; New York : Springer-Verlag, 1984.

Filter by

Item details
Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	JSE 86-836	Offsite

Additional Authors

Description

xi, 205 p. : ill.; 25 cm.

Series Statement

Topics in current physics ; 37

Subject

Bibliography (note)

Call Number

JSE 86-836

ISBN

0387133208 (U.S.)

LCCN

84005394

OCLC

Title

Thin film and depth profile analysis / edited by H. Oechsner ; with contributions by H.-W. Etzkorn ... [et al.].

Imprint

Berlin ; New York : Springer-Verlag, 1984.

Series

Topics in current physics ; 37

Bibliography

Includes bibliographies and index.

Added Author

Oechsner, H. (Hans), 1934-

Etzkorn, H. W.

Research Call Number

JSE 86-836