Research Catalog

Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors

Title
Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
Author
IEEE Workshop on Simulation & Test Generation Environments (1985 : San Francisco, Calif.)
Publication
Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.

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Details

Additional Authors
  • IEEE Computer Society.
  • IEEE Computer Society. Test Technology Committee.
Description
vii, 179 p. : ill.; 28 cm.
Subject
  • Integrated circuits > Testing > Congresses
  • Automatic test equipment > Congresses
Note
  • "IEEE Computer Society order number 732."
  • "IEEE catalog number 86CH2296-2."
  • Title on cover and spine: 1985/1986 Workshop on Simulation and test Generation Environment.
Bibliography (note)
  • Includes bibliographies and index.
Call Number
JSF 86-900
ISBN
  • 0818607327 (pbk.)
  • 0818687320 (hard)
  • 0818647329 (microfiche)
LCCN
86080457
OCLC
  • 14003067
  • 14003067
Conference
IEEE Workshop on Simulation & Test Generation Environments (1985 : San Francisco, Calif.)
Title
Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
Imprint
Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
Bibliography
Includes bibliographies and index.
Added Author
IEEE Computer Society.
IEEE Computer Society. Test Technology Committee.
Research Call Number
JSF 86-900
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