Research Catalog

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987

Title: Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
Author: International Test Conference (1987 : Washington, D.C.)
Publication: Washington, D.C. : IEEE Computer Society Press, c1987.

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Details

Additional Authors

Description

xxxi, 1151 p. : ill.; 29 cm.

Alternative Title

1987 IEEE International Test Conference.
IEEE International Test Conference, 1987.

Subjects

Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses

Note

"IEEE catalog no. 87CH2437-2."
Cover and spine title: 1987 IEEE International Test Conference.

Bibliography (note)

Includes bibliographies and index.

Call Number

JSF 88-918

ISBN

081860798X (pbk.)
0818647981 (microfiche)
0818687983 (hard)

LCCN

87080439

OCLC

70340695
NYPG88-B10646

Conference

International Test Conference (1987 : Washington, D.C.)

Title

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.

Imprint

Washington, D.C. : IEEE Computer Society Press, c1987.

Bibliography

Includes bibliographies and index.

Added Author

IEEE Computer Society.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Added Title

1987 IEEE International Test Conference.

IEEE International Test Conference, 1987.

Research Call Number

JSF 88-918

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