Research Catalog
Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis
- Title
- Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.
- Author
- Wilson, Robert G.
- Publication
- New York : Wiley, c1989.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 90-539 | Offsite |
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Details
- Additional Authors
- Description
- 1 v. (various pagings) : ill.; 26 cm.
- Subject
- Note
- "A Wiley-Interscience publication."
- Includes index.
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- JSF 90-539
- ISBN
- 0471519456
- LCCN
- 89022460
- OCLC
- 20168488
- 20168488
- Author
- Wilson, Robert G.
- Title
- Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.
- Imprint
- New York : Wiley, c1989.
- Bibliography
- Includes bibliographical references.
- Added Author
- Stevie, F. A.Magee, C. W.
- Research Call Number
- JSF 90-539