Research Catalog
Accelerated testing : statistical models, test plans and data analysis
- Title
- Accelerated testing : statistical models, test plans and data analysis / Wayne Nelson.
- Author
- Nelson, Wayne, 1936-
- Publication
- New York : Wiley, c1990.
Items in the Library & Off-site
Filter by
1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 90-1668 | Offsite |
Details
- Description
- xiv, 601 p. : ill.; 25 cm.
- Series Statement
- Wiley series in probability and mathematical statistics. Applied probability and statistics section
- Uniform Title
- Wiley series in probability and mathematical statistics. Applied probability and statistics.
- Subject
- Note
- "A Wiley-Interscience publication."
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- JSE 90-1668
- ISBN
- 0471522775
- LCCN
- 89024853
- OCLC
- 20454343
- NYPG90-B13796
- Author
- Nelson, Wayne, 1936-
- Title
- Accelerated testing : statistical models, test plans and data analysis / Wayne Nelson.
- Imprint
- New York : Wiley, c1990.
- Series
- Wiley series in probability and mathematical statistics. Applied probability and statistics sectionWiley series in probability and mathematical statistics. Applied probability and statistics.
- Bibliography
- Includes bibliographical references.
- Research Call Number
- JSE 90-1668