Research Catalog

Testing and reliable design of CMOS circuits

Title: Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.
Author: Jha, Niraj K.
Publication: Boston : Kluwer Academic Publishers, c1990.

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Additional Authors

Kundu, Sandip.

Description

xii, 231 p. : ill.; 25 cm.

Series Statement

Kluwer international series in engineering and computer science ; SECS 88. VLSI, computer architecture, and digital signal processing

Uniform Title

Kluwer international series in engineering and computer science ; SECS 88.

Subject

Bibliography (note)

Call Number

JSE 90-764

ISBN

0792390563

LCCN

89037031

OCLC

Author

Jha, Niraj K.

Title

Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

Imprint

Boston : Kluwer Academic Publishers, c1990.

Series

Kluwer international series in engineering and computer science ; SECS 88. VLSI, computer architecture, and digital signal processing

Kluwer international series in engineering and computer science ; SECS 88.

Bibliography

Includes bibliographical references.

Added Author

Kundu, Sandip.

Research Call Number

JSE 90-764