Research Catalog
Surface and interface characterization by electron optical methods
- Title
- Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè.
- Publication
- New York : Plenum Press : Published in cooperation with the NATO Scientific Affairs Division, c1988.
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Status | Format | Access | Call Number | Item Location |
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Text | Request in advance | JSF 89-101 | Offsite |
Details
- Additional Authors
- Description
- viii, 319 p. : ill. (some col.); 26 cm.
- Series Statement
- NATO ASI series. v. 191
- Subject
- Note
- "Proceedings of a NATO Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques, held April 4-15, 1987, in Erice, Sicily, Italy"--T.p. verso.
- Bibliography (note)
- Includes bibliographies and index.
- Call Number
- JSF 89-101
- ISBN
- 030643086X
- LCCN
- 88028989
- OCLC
- 18559146
- NYPG89-B43286
- Title
- Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè.
- Imprint
- New York : Plenum Press : Published in cooperation with the NATO Scientific Affairs Division, c1988.
- Series
- NATO ASI series. Series B. Physics ; v. 191
- Bibliography
- Includes bibliographies and index.
- Added Author
- Howie, A.Valdrè, U. (Ugo)
- Research Call Number
- JSF 89-101