Research Catalog

Surface and interface characterization by electron optical methods

Title
Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè.
Publication
New York : Plenum Press : Published in cooperation with the NATO Scientific Affairs Division, c1988.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance JSF 89-101Offsite

Details

Additional Authors
  • Howie, A.
  • Valdrè, U. (Ugo)
Description
viii, 319 p. : ill. (some col.); 26 cm.
Series Statement
NATO ASI series. v. 191
Subject
  • Surfaces (Physics) > Technique > Congresses
  • Electron microscopy > Congresses
  • Transmission electron microscopes > Congresses
Note
  • "Proceedings of a NATO Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques, held April 4-15, 1987, in Erice, Sicily, Italy"--T.p. verso.
Bibliography (note)
  • Includes bibliographies and index.
Call Number
JSF 89-101
ISBN
030643086X
LCCN
88028989
OCLC
  • 18559146
  • NYPG89-B43286
Title
Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè.
Imprint
New York : Plenum Press : Published in cooperation with the NATO Scientific Affairs Division, c1988.
Series
NATO ASI series. Series B. Physics ; v. 191
Bibliography
Includes bibliographies and index.
Added Author
Howie, A.
Valdrè, U. (Ugo)
Research Call Number
JSF 89-101
View in Legacy Catalog