Research Catalog

Neural models and algorithms for digital testing

Title: Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.
Author: Chakradhar, Srimat T.
Publication: Boston : Kluwer Academic Publishers, c1991.

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Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	JSE 91-1956	Offsite

Additional Authors

Description

xii, 184 p. : ill.; 25 cm.

Series Statement

The Kluwer international series in engineering and computer science ; SECS 140. VLSI, computer architecture, and digital signal processing

Uniform Title

Subject

Bibliography (note)

Call Number

JSE 91-1956

ISBN

0792391659 (acid-free paper)

LCCN

91015225

OCLC

Author

Chakradhar, Srimat T.

Title

Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.

Imprint

Boston : Kluwer Academic Publishers, c1991.

Series

The Kluwer international series in engineering and computer science ; SECS 140. VLSI, computer architecture, and digital signal processing

Kluwer international series in engineering and computer science ; SEC 140.

Kluwer international series in engineering and computer science ; SECS 140.

Bibliography

Includes bibliographical references and index.

Added Author

Agrawal, Vishwani D., 1943-

Bushnell, Michael L. (Michael Lee), 1950-

Research Call Number

JSE 91-1956