Research Catalog

Assessing fault model and test quality

Title: Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer.
Author: Butler, Kenneth M., 1962-
Publication: Boston : Kluwer Academic, c1992.

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Additional Authors

Mercer, Melvin Ray.

Description

xviii, 132 p. : ill.; 25 cm.

Series Statement

The Kluwer international series in engineering and computer science ; SECS 157. VLSI, computer architecture, and digital signal processing

Uniform Title

Kluwer international series in engineering and computer science ; SECS 157.
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.

Subjects

Bibliography (note)

Call Number

JSE 92-180

ISBN

0792392221 (acid-free paper)

LCCN

91032602

OCLC

Author

Butler, Kenneth M., 1962-

Title

Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer.

Imprint

Boston : Kluwer Academic, c1992.

Series

The Kluwer international series in engineering and computer science ; SECS 157. VLSI, computer architecture, and digital signal processing

Kluwer international series in engineering and computer science ; SECS 157.

Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.

Bibliography

Includes bibliographical references (p. [109]-125) and index.

Added Author

Mercer, Melvin Ray.

Research Call Number

JSE 92-180