Research Catalog
Testing and diagnosis of analog circuits and systems
- Title
- Testing and diagnosis of analog circuits and systems / edited by Ruey-wen Liu.
- Publication
- New York, N.Y. : Van Nostrand Reinhold, c1991.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 92-870 | Offsite |
Details
- Additional Authors
- Liu, Ruey-Wen.
- Description
- xiv, 284 p. : ill.; 24 cm.
- Subject
- Analog electronic systems > Testing
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSE 92-870
- ISBN
- 0442259328
- LCCN
- 90045217
- OCLC
- 22305076
- NYPG91-B33131
- Title
- Testing and diagnosis of analog circuits and systems / edited by Ruey-wen Liu.
- Imprint
- New York, N.Y. : Van Nostrand Reinhold, c1991.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Liu, Ruey-Wen.
- Research Call Number
- JSE 92-870