Research Catalog

The measurement of intelligence an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale

Title: The measurement of intelligence [microform] ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman.
Author: Terman, Lewis Madison, 1877-1956.
Publication: Boston, New York [etc.] Houghton Mifflin Co. [c1916]

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Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	no. 1-5	Text	Request in advance	*Z-6160 no. 1-5	Offsite

Details

Description

xviii, 362 p. illus., diagrs.; 20 cm.

Donor/Sponsor

National Endowment for the Humanities Preservation Grant 1, 1990/1994.

Series Statement

Riverside textbooks in education

Subject

Note

Includes index.
"Suggestions for a teacher's private library on exceptional children":p. [357]-358.

Bibliography (note)

Bibliography: p. [349]-356.

Reproduction (note)

Microfilm.

Call Number

*Z-6160 no. 2

OCLC

NYPG92-B26921

Author

Terman, Lewis Madison, 1877-1956.

Title

The measurement of intelligence [microform] ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman.

Imprint

Boston, New York [etc.] Houghton Mifflin Co. [c1916]

Series

Riverside textbooks in education

Bibliography

Bibliography: p. [349]-356.

Reproduction

Microfilm. New York : New York Public Library, 1992. 1 microfilm reel ; 35 mm. (MN *ZZ-32448).

Research Call Number

*Z-6160 no. 2 [Microfilm]

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