Research Catalog
Critical phenomena at surfaces and interfaces : evanescent X-ray and neutro scattering
- Title
- Critical phenomena at surfaces and interfaces : evanescent X-ray and neutro scattering / Helmut Dosch.
- Author
- Dosch, Helmut, 1955-
- Publication
- Berlin ; New York : Springer-Verlag, c1992.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Request in advance | JSE 92-1317 | Offsite |
Details
- Description
- x, 145 p. : ill.; 25 cm.
- Series Statement
- Springer tracts in modern physics ; 126
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSE 92-1317
- ISBN
- 0387545344 (New York)
- 3540545344 (Berlin)
- LCCN
- 91037384
- OCLC
- 24630749
- NYPG92-B75389
- Author
- Dosch, Helmut, 1955-
- Title
- Critical phenomena at surfaces and interfaces : evanescent X-ray and neutro scattering / Helmut Dosch.
- Imprint
- Berlin ; New York : Springer-Verlag, c1992.
- Series
- Springer tracts in modern physics ; 126
- Bibliography
- Includes bibliographical references and index.
- Research Call Number
- JSE 92-1317