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Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

Title: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.
Publication: Pittsburgh, Pa. : Materials Research Society, c1991.

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Details

Additional Authors

Description

xiii, 358 p. : ill.; 24 cm.

Series Statement

Materials Research Society symposium proceedings ; v. 225

Uniform Title

Materials Research Society symposia proceedings ; v. 225.

Subject

Microelectronics > Reliability > Congresses
Microelectronics > Materials > Testing > Congresses
Electrodiffusion > Congresses
Microstructure > Congresses

Note

Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics.

Bibliography (note)

Includes bibliogrpahical references and index.

Call Number

JSE 92-1899

ISBN

1558991190

LCCN

91030404

OCLC

24429846
NYPG93-B3500

Title

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

Imprint

Pittsburgh, Pa. : Materials Research Society, c1991.

Series

Materials Research Society symposium proceedings ; v. 225

Materials Research Society symposia proceedings ; v. 225.

Bibliography

Includes bibliogrpahical references and index.

Added Author

Lloyd, J. R. (James R.)

Yost, Frederick G.

Ho, P. S.

Materials Research Society.

MRS Symposium on Materials Reliability Issues in Microelectronics (1st : 1991 : Anaheim, Calif.)

Research Call Number

JSE 92-1899

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