Research Catalog

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.

Title
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Publication
Pittsburgh, Pa. : Materials Research Society, c1990.

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Details

Additional Authors
  • Sinclair, Robert.
  • Smith, David J., 1948-
  • Dahmen, Ulrich.
  • Materials Research Society.
Description
xi, 391 p. : ill.; 24 cm.
Series Statement
Materials Research Society symposium proceedings, 0272-9172 ; v. 183
Uniform Title
Materials Research Society symposia proceedings ; v. 183.
Subject
  • Materials > Microscopy > Congresses
  • Materials > Defects > Congresses
  • Electron microscopy > Congresses
Bibliography (note)
  • Includes bibliographical references and indexes.
Call Number
JSE 92-1914
ISBN
1558990720
LCCN
90041466
OCLC
  • 22117610
  • NYPG93-B3521
Title
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Imprint
Pittsburgh, Pa. : Materials Research Society, c1990.
Series
Materials Research Society symposium proceedings, 0272-9172 ; v. 183
Materials Research Society symposia proceedings ; v. 183.
Bibliography
Includes bibliographical references and indexes.
Added Author
Sinclair, Robert.
Smith, David J., 1948-
Dahmen, Ulrich.
Materials Research Society.
Research Call Number
JSE 92-1914
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