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High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.

Title: High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Publication: Pittsburgh, Pa. : Materials Research Society, c1990.

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Details

Additional Authors

Description

xi, 391 p. : ill.; 24 cm.

Series Statement

Materials Research Society symposium proceedings, 0272-9172 ; v. 183

Uniform Title

Materials Research Society symposia proceedings ; v. 183.

Subjects

Bibliography (note)

Includes bibliographical references and indexes.

Call Number

JSE 92-1914

ISBN

1558990720

LCCN

90041466

OCLC

22117610
NYPG93-B3521

Title

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.

Imprint

Pittsburgh, Pa. : Materials Research Society, c1990.

Series

Materials Research Society symposium proceedings, 0272-9172 ; v. 183

Materials Research Society symposia proceedings ; v. 183.

Bibliography

Includes bibliographical references and indexes.

Added Author

Sinclair, Robert.

Smith, David J., 1948-

Dahmen, Ulrich.

Materials Research Society.

Research Call Number

JSE 92-1914

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