Research Catalog

ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain

Title: ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain / sponsored by the IEEE Electron Devices Society.
Author: IEEE International Conference on Microelectronic Test Structures (1993 : Barcelona, Spain)
Publication: New York, NY : Institute of Electrical and Electronics Engineers, c1993.

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Details

Additional Authors

IEEE Electron Devices Society.

Description

xv, 298 p. : ill.; 28 cm.

Alternative Title

1993 IEEE International Conference on Microelectronic Test Structures.

Subject

Integrated circuits > Testing > Congresses

Note

"93CH3220-1."
Cover and spine title: 1993 IEEE International Conference on Microelectronic Test Structures.

Bibliography (note)

Includes bibliographical references and index.

Call Number

JSF 94-113

ISBN

0780308581 (case)
0780308573 (pbk)
078030859X (microfiche)

LCCN

92056792

OCLC

28463560
NYPG94-B10666

Conference

IEEE International Conference on Microelectronic Test Structures (1993 : Barcelona, Spain)

Title

ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain / sponsored by the IEEE Electron Devices Society.

Imprint

New York, NY : Institute of Electrical and Electronics Engineers, c1993.

Bibliography

Includes bibliographical references and index.

Added Author

IEEE Electron Devices Society.

Added Title

1993 IEEE International Conference on Microelectronic Test Structures.

Research Call Number

JSF 94-113

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