Research Catalog

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

Title: Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 / edited by M.R. Brozel, D.J. Stirland.
Author: International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England)
Publication: Philadelphia : Adam Hilger, 1992.

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Details

Additional Authors

Description

310 p. : ill., port.; 30 cm.

Alternative Title

International Symposium on Defect Recognition and Image Processing in three-five compounds.

Subjects

Bibliography (note)

Includes bibliographical references.

Call Number

JSG 94-21

ISBN

0750301880

LCCN

92006513

OCLC

123244390
NYPG94-B13321

Conference

International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England)

Title

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 / edited by M.R. Brozel, D.J. Stirland.

Imprint

Philadelphia : Adam Hilger, 1992.

Bibliography

Includes bibliographical references.

Added Author

Brozel, M. R. (Michael R.)

Stirland, D. J. (Derek J.)

Added Title

International Symposium on Defect Recognition and Image Processing in three-five compounds.

Research Call Number

JSG 94-21

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