Research Catalog
Proceedings, International Test Conference, 1993.
- Title
- Proceedings, International Test Conference, 1993.
- Author
- International Test Conference (24th : 1993)
- Publication
- Altoona, PA : International Test Conference ; Piscataway, NJ : additional copies can be ordered from IEEE Service Center, c1993.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 94-128 | Offsite |
Details
- Additional Authors
- Institute of Electrical and Electronics Engineers.
- Description
- xii, 1065 p. : ill.; 29 cm.
- Alternative Title
- 1993 IEEE International Test Conference.
- Subject
- Note
- "IEEE catalog number 93CH3356-3"--T.p. verso.
- Cover and spine title: 1993 IEEE International Test Conference.
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 94-128
- ISBN
- 0780314301 (case)
- 0780314298 (soft)
- 078031431X (microfiche)
- LCCN
- 93080010
- OCLC
- 29588302
- NYPG94-B14995
- Conference
- International Test Conference (24th : 1993)
- Title
- Proceedings, International Test Conference, 1993.
- Imprint
- Altoona, PA : International Test Conference ; Piscataway, NJ : additional copies can be ordered from IEEE Service Center, c1993.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Institute of Electrical and Electronics Engineers.
- Added Title
- 1993 IEEE International Test Conference.
- Research Call Number
- JSF 94-128