Research Catalog
Electron beam testing technology
- Title
- Electron beam testing technology / edited by John T.L. Thong.
- Publication
- New York : Plenum Press, c1993.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 94-431 | Offsite |
Details
- Additional Authors
- Thong, John T. L.
- Description
- xvi, 462 p. : ill.; 26 cm.
- Series Statement
- Microdevices
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 94-431
- ISBN
- 0306443600
- LCCN
- 93018555
- OCLC
- 27725615
- NYPG93-B50797
- Title
- Electron beam testing technology / edited by John T.L. Thong.
- Imprint
- New York : Plenum Press, c1993.
- Series
- Microdevices
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Thong, John T. L.
- Research Call Number
- JSF 94-431