Research Catalog
1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California
- Title
- 1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California / sponsored by the IEEE Electron Devices Society.
- Author
- IEEE International Conference on Microelectronic Test Structures (1997 : Monterey, Calif.)
- Publication
- Piscataway, NJ : IEEE Service Center, c1997.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 97-318 | Offsite |
Details
- Additional Authors
- IEEE Electron Devices Society.
- Description
- viii, 225 p. : ill.; 30 cm.
- Alternative Title
- IEEE International Conference on Microelectronic Test Structures proceedings
- International Conference on Microelectronic Test Structures proceedings
- Subjects
- Note
- "97CH35914."
- "97CB35914"--Spine.
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 97-318
- ISBN
- 0780332431 (softbound)
- 078033244X (casebound)
- 0780332458 (microfiche)
- LCCN
- 96075517
- OCLC
- 37046789
- Conference
- IEEE International Conference on Microelectronic Test Structures (1997 : Monterey, Calif.)
- Title
- 1997 IEEE International Conference on Microelectronic Test Structures proceedings : March 17-20, 1997, Monterey, California / sponsored by the IEEE Electron Devices Society.
- Imprint
- Piscataway, NJ : IEEE Service Center, c1997.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- IEEE Electron Devices Society.
- Research Call Number
- JSF 97-318