Research Catalog
25th anniversary compendium of papers from International Test Conference
- Title
- 25th anniversary compendium of papers from International Test Conference / edited by Paul H. Bardell ... [et al.].
- Author
- International Test Conference (25th : 1994 : Philadelphia, Pa.)
- Publication
- Los Alamitos, Calif. : IEEE Computer Society Press, c1994.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 95-945 | Offsite |
Details
- Additional Authors
- Description
- xv, 794 p. : ill.; 28 cm.
- Alternative Title
- Compendium of papers from International Test Conference.
- Twenty-fifth anniversary compendium of papers from International Test Conference.
- Subjects
- Note
- Spine title: Compendium of papers from International Test Conference.
- At head of title: 1970-1994.
- "IEEE catalog number EH04085 ; IEEE Computer Society Press order number 6617-01"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 95-945
- ISBN
- 081866617X
- 081866161 (microfiche) (canceled/invalid)
- LCCN
- 94077462
- OCLC
- 31440992
- Conference
- International Test Conference (25th : 1994 : Philadelphia, Pa.)
- Title
- 25th anniversary compendium of papers from International Test Conference / edited by Paul H. Bardell ... [et al.].
- Imprint
- Los Alamitos, Calif. : IEEE Computer Society Press, c1994.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Institute of Electrical and Electronics Engineers.IEEE Computer Society.IEEE Computer Society. Philadelphia Chapter.
- Added Title
- Compendium of papers from International Test Conference.Twenty-fifth anniversary compendium of papers from International Test Conference.
- Research Call Number
- JSF 95-945