Research Catalog

Characterization methods for submicron MOSFETs

Title: Characterization methods for submicron MOSFETs / edited by Hisham Haddara.
Publication: Boston : Kluwer Academic Publishers, c1995.

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Additional Authors

Haddara, Hisham.

Description

vii, 232 p. : ill.; 24 cm.

Series Statement

The Kluwer international series in engineering and computer science ; SECS 352. Analog circuits and signal processing

Uniform Title

Kluwer international series in engineering and computer science ; SECS 352.
Kluwer international series in engineering and computer science. Analog circuits and signal processing.

Subject

Bibliography (note)

Call Number

JSE 96-597

ISBN

0792396952 (acid-free paper)

LCCN

95050306

OCLC

33818512

Title

Characterization methods for submicron MOSFETs / edited by Hisham Haddara.

Imprint

Boston : Kluwer Academic Publishers, c1995.

Series

The Kluwer international series in engineering and computer science ; SECS 352. Analog circuits and signal processing

Kluwer international series in engineering and computer science ; SECS 352.

Kluwer international series in engineering and computer science. Analog circuits and signal processing.

Bibliography

Includes bibliographical references and index.

Indexed Term

Transistors

Added Author

Haddara, Hisham.

Research Call Number

JSE 96-597