Research Catalog
X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
- Title
- X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre ... [et al.].
- Publication
- Berlin ; New York : Springer-Verlag, 1988.
Items in the Library & Off-site
Filter by
1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 88-3635 | Offsite |
Details
- Additional Authors
- Description
- xiv, 454 p. : ill., (1 col.); 24 cm.
- Series Statement
- Springer series in optical sciences ; v. 56
- Subject
- X-ray microscopes > Congresses
- Note
- Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory.
- Bibliography (note)
- Includes bibliographies and indexes.
- Call Number
- JSE 88-3635
- ISBN
- 0387193928 (U.S.)
- LCCN
- 88020043
- OCLC
- NYPG89-B8622
- Title
- X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre ... [et al.].
- Imprint
- Berlin ; New York : Springer-Verlag, 1988.
- Series
- Springer series in optical sciences ; v. 56
- Bibliography
- Includes bibliographies and indexes.
- Added Author
- Sayre, David.International Symposium on X-ray Microscopy (2nd : 1987 : Brookhaven, N.Y.)
- Research Call Number
- JSE 88-3635