Research Catalog

New frontiers in testing : International Test Conference, 1988, proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, D. C.

Title: New frontiers in testing : International Test Conference, 1988, proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, D. C. / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee, and IEEE Philadelphia Section.
Author: International Test Conference (1988 : Washington, D.C.)
Publication: Washington, D.C. : Computer Society Press of the IEEE, c1988.

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Details

Additional Authors

Description

xxx, 1005 p. : ill., ports.; 29 cm.

Subjects

Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses

Note

"Computer Society Order number 870."
"IEEE catalog no. 88CH2610-4."

Bibliography (note)

Includes bibliographies and index.

Call Number

JSF 88-538

ISBN

081868870X

LCCN

88070912

OCLC

18579396
NYPG89-B5863

Conference

International Test Conference (1988 : Washington, D.C.)

Title

New frontiers in testing : International Test Conference, 1988, proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, D. C. / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee, and IEEE Philadelphia Section.

Imprint

Washington, D.C. : Computer Society Press of the IEEE, c1988.

Bibliography

Includes bibliographies and index.

Added Author

IEEE Computer Society. Test Technology Technical Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Research Call Number

JSF 88-538

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