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Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995

Title
Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995 / editors, Paul S. Ho ... [et al.].
Publication
New York : American Institute of Physics, c1996.

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Details

Additional Authors
Ho, P. S.
Description
vii, 304 p. : ill.; 25 cm.
Series Statement
AIP conference proceedings ; no. 373
Subject
  • Semiconductors > Defects > Congresses
  • Metallic films > Congresses
  • Thin film devices > Defects > Congresses
  • Aluminum films > Congresses
Note
  • "DOE CONF-9506336"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
Call Number
JSE 96-1187
ISBN
1563964392
LCCN
96084949
OCLC
35079381
Title
Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995 / editors, Paul S. Ho ... [et al.].
Imprint
New York : American Institute of Physics, c1996.
Series
AIP conference proceedings ; no. 373
Bibliography
Includes bibliographical references and index.
Added Author
Ho, P. S.
Research Call Number
JSE 96-1187
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