Research Catalog
Digital circuit testing and testability
- Title
- Digital circuit testing and testability / Parag K. Lala.
- Author
- Lala, Parag K., 1948-
- Publication
- San Diego : Academic Press, c1997.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSE 97-224 | Offsite |
Details
- Description
- xii, 199 p. : ill.; 24 cm.
- Subjects
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSE 97-224
- ISBN
- 0124343309 (alk. paper)
- LCCN
- 96042114
- OCLC
- 35317862
- Author
- Lala, Parag K., 1948-
- Title
- Digital circuit testing and testability / Parag K. Lala.
- Imprint
- San Diego : Academic Press, c1997.
- Bibliography
- Includes bibliographical references and index.
- Research Call Number
- JSE 97-224