Research Catalog
Proceedings, International Test Conference 1997.
- Title
- Proceedings, International Test Conference 1997.
- Publication
- Washington, DC : International Test Conference ; Piscataway N.J. : Additional copies can be ordered from the IEEE Service Center, c1997.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | JSF 98-19 | Offsite |
Details
- Additional Authors
- Description
- xiv, 1054 p. : ill.; 28 cm.
- Alternative Title
- International Test Conference 1997
- 1997 IEEE International Test Conference
- Subjects
- Note
- "IEEE catalog number 97CH36126"--T.p. verso.
- "IEEE Computer Society Press order number RS00161" -- T.p. verso.
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSF 98-19
- ISBN
- 0780342097 (softbound)
- 0780342100 (casebound)
- 0780342119 (microfiche)
- 0780342127 (CD-ROM)
- OCLC
- 39465015
- 38127789
- Title
- Proceedings, International Test Conference 1997.
- Imprint
- Washington, DC : International Test Conference ; Piscataway N.J. : Additional copies can be ordered from the IEEE Service Center, c1997.
- Bibliography
- Includes bibliographical references and index.
- Added Author
- Institute of Electrical and Electronics Engineers.IEEE Computer Society.
- Cover Title
- 1997 IEEE International Test Conference
- Research Call Number
- JSF 98-19