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Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development

Title: Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.
Author: Kuo, Way, 1951-
Publication: Boston, Mass : Kluwer Academic Publishers, c1998.

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Additional Authors

Description

xxvi, 394 p. : ill.; 24 cm.

Subjects

Bibliography (note)

Includes bibliographical references (p. [333]-361) and index.

Call Number

JSE 98-475

ISBN

0792381076 (alk. paper)

LCCN

97039195

OCLC

vendor

Author

Kuo, Way, 1951-

Title

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.

Imprint

Boston, Mass : Kluwer Academic Publishers, c1998.

Bibliography

Includes bibliographical references (p. [333]-361) and index.

Added Author

Chien, Wei-Ting Kary, 1965-

Kim, Taeho, 1960-

Research Call Number

JSE 98-475

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