Research Catalog

Measurement techniques for thin films.

Title: Measurement techniques for thin films. Edited by Bertram Schwartz and Newton Schwartz.
Publication: New York, Electronics Division and Dielectrics and Insulation Division, Electrochemical Society [1967]

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Additional Authors

Description

vi, 364 p. illus.; 22 cm.

Subjects

Note

Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society.

Call Number

VIB (Measurement techniques for thin films)

LCCN

67019860

OCLC

2034551

Title

Measurement techniques for thin films. Edited by Bertram Schwartz and Newton Schwartz.

Imprint

New York, Electronics Division and Dielectrics and Insulation Division, Electrochemical Society [1967]

Added Author

Schwartz, Bertram.

Schwartz, Newton.

Electrochemical Society. Electronics Division.

Electrochemical Society. Dielectrics and Insulation Division.

Research Call Number

VIB (Measurement techniques for thin films)