Research Catalog

Semiconductor reliability.

Title: Semiconductor reliability.
Publication: Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]

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Item details
Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 2	Text	Request in advance	TTE (Semiconductor reliability) v. 2	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	v. 1	Text	Request in advance	TTE (Semiconductor reliability) v. 1	Offsite

Additional Authors

Description

2 v. illus., diagrs., tables.; 24 cm.

Subject

Note

Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.

Bibliography (note)

Call Number

TTE (Semiconductor reliability)

LCCN

61012685 //r842

OCLC

2834840

Title

Semiconductor reliability.

Imprint

Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]

Bibliography

Includes bibliographies.

Added Author

Shwop, John E.

Von Alven, William H.

United States. Advisory Group on Electron Tubes.

Aerospace Industries Association of America.

Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.)

Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.)

Research Call Number

TTE (Semiconductor reliability)