Research Catalog
ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA
- Title
- ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
- Author
- International Test Conference (29th : 1998 : Washington, D.C.)
- Publication
- Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1998.
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Not available - Please for assistance. | Text | Request in advance | JSF 99-11 | Offsite |
Details
- Additional Authors
- Description
- xv, 1179 p. : ill.; 28 cm.
- Alternative Title
- 1998 IEEE International Test Conference
- Subject
- Note
- "IEEE Catalog Number 98CH36270"--verso of T.p.
- Bibliography (note)
- Includes bibliographical references and author index.
- Call Number
- JSF 99-11
- ISBN
- 0780350928 (softbound)
- 0780350936 (casebound)
- 0780350944 (microfiche)
- OCLC
- 41121821
- 40346893
- Conference
- International Test Conference (29th : 1998 : Washington, D.C.)
- Title
- ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
- Imprint
- Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1998.
- Bibliography
- Includes bibliographical references and author index.
- Added Author
- IEEE Computer Society.Institute of Electrical and Electronics Engineers. Philadelphia Section.
- Cover Title
- 1998 IEEE International Test Conference
- Research Call Number
- JSF 99-11