Research Catalog

High-resolution X-ray scattering from thin films and multilayers

Title
High-resolution X-ray scattering from thin films and multilayers / Vaclav Holy, Ullrich Pietsch, Tilo Baumbach.
Author
Holy, Vaclav.
Publication
Berlin ; New York : Springer, c1999.

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StatusVol/DateFormatAccessCall NumberItem Location
v. 149TextRequest in advance JSL 95-212 v. 149Offsite

Details

Additional Authors
  • Pietsch, Ulrich.
  • Baumbach, Tilo, 1961-
Description
xi, 256 p. : ill.; 24 cm.
Series Statement
Springer tracts in modern physics ; vol. 149
Uniform Title
Springer tracts in modern physics ; 149.
Subject
  • Thin films > Optical properties
  • Thin films, Multilayered > Optical properties
  • X-rays > Scattering
  • X-rays > Diffraction
Bibliography (note)
  • Includes bibliographical references ([243]-246) and index.
Call Number
JSL 95-212 v. 149
ISBN
354062029X (hardcover : alk. paper)
LCCN
98047149
OCLC
  • 40142969
  • 40643969
Author
Holy, Vaclav.
Title
High-resolution X-ray scattering from thin films and multilayers / Vaclav Holy, Ullrich Pietsch, Tilo Baumbach.
Imprint
Berlin ; New York : Springer, c1999.
Series
Springer tracts in modern physics ; vol. 149
Springer tracts in modern physics ; 149.
Bibliography
Includes bibliographical references ([243]-246) and index.
Added Author
Pietsch, Ulrich.
Baumbach, Tilo, 1961-
Research Call Number
JSL 95-212 v. 149
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